An Optimal Design for Parallel Test Generation Based on Circuit Partitioning

Dong Xiang, Dao-zheng Wei. An Optimal Design for Parallel Test Generation Based on Circuit Partitioning. In VLSI Design. pages 297-300, 1994.

Authors

Dong Xiang

This author has not been identified. Look up 'Dong Xiang' in Google

Dao-zheng Wei

This author has not been identified. Look up 'Dao-zheng Wei' in Google