Dong Xiang, Dao-zheng Wei. An Optimal Design for Parallel Test Generation Based on Circuit Partitioning. In VLSI Design. pages 297-300, 1994.
@inproceedings{XiangW94,
title = {An Optimal Design for Parallel Test Generation Based on Circuit Partitioning},
author = {Dong Xiang and Dao-zheng Wei},
year = {1994},
tags = {rule-based, testing, partitioning, design},
researchr = {https://researchr.org/publication/XiangW94},
cites = {0},
citedby = {0},
pages = {297-300},
booktitle = {VLSI Design},
}