Dong Xiang, Yi Xu. Cost-Effective Non-Scan Design for Testability for Actual Testability Improvement. In 19th International Conference on Computer Design (ICCD 2001), VLSI in Computers and Processors, 23-26 September 2001, Austin, TX, USA, Proceedings. pages 154-160, IEEE Computer Society, 2001.
@inproceedings{XiangX01:0,
title = {Cost-Effective Non-Scan Design for Testability for Actual Testability Improvement},
author = {Dong Xiang and Yi Xu},
year = {2001},
tags = {testing, design},
researchr = {https://researchr.org/publication/XiangX01%3A0},
cites = {0},
citedby = {0},
pages = {154-160},
booktitle = {19th International Conference on Computer Design (ICCD 2001), VLSI in Computers and Processors, 23-26 September 2001, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1200-3},
}