A reliability evaluation method for electromagnetic relays based on a novel degradation-threshold-shock model with two-sided failure thresholds

Shihu Xiang, Changdong Zhao, Songhua Hao, Kui Li, Wenhua Li. A reliability evaluation method for electromagnetic relays based on a novel degradation-threshold-shock model with two-sided failure thresholds. Rel. Eng. & Sys. Safety, 240:109549, December 2023. [doi]

Abstract

Abstract is missing.