Huimin Xie, Anand Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi. High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectronics Reliability, 42(8):1219-1227, 2002. [doi]
Abstract is missing.