Feng Xie, James Bieron, Pieter Peers, Pat Hanrahan. Experimental Analysis of Multiple Scattering BRDF Models. In Shuzo John Shiota, Ayumi Kimura, Wan-Chun Alex Ma, editors, SA '21: SIGGRAPH Asia 2021 Technical Communications, Tokyo, Japan, December 14 - 17, 2021. ACM, 2021. [doi]
Abstract is missing.