Detection and Classification of Defect Patterns in Optical Inspection Using Support Vector Machines - researchr publication authors

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Liangjun Xie, Rui Huang, Zhiqiang Cao. Detection and Classification of Defect Patterns in Optical Inspection Using Support Vector Machines. In De-Shuang Huang, Vitoantonio Bevilacqua, Juan Carlos Figueroa García, Prashan Premaratne, editors, Intelligent Computing Theories - 9th International Conference, ICIC 2013, Nanning, China, July 28-31, 2013. Proceedings. Volume 7995 of Lecture Notes in Computer Science, pages 376-384, Springer, 2013. [doi]

This author has not been identified. Look up 'Liangjun Xie' in GoogleThis author has not been identified. Look up 'Rui Huang' in GoogleThis author has not been identified. Look up 'Zhiqiang Cao' in Google

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