Detection and Classification of Defect Patterns in Optical Inspection Using Support Vector Machines

Liangjun Xie, Rui Huang, Zhiqiang Cao. Detection and Classification of Defect Patterns in Optical Inspection Using Support Vector Machines. In De-Shuang Huang, Vitoantonio Bevilacqua, Juan Carlos Figueroa García, Prashan Premaratne, editors, Intelligent Computing Theories - 9th International Conference, ICIC 2013, Nanning, China, July 28-31, 2013. Proceedings. Volume 7995 of Lecture Notes in Computer Science, pages 376-384, Springer, 2013. [doi]

@inproceedings{XieHC13,
  title = {Detection and Classification of Defect Patterns in Optical Inspection Using Support Vector Machines},
  author = {Liangjun Xie and Rui Huang and Zhiqiang Cao},
  year = {2013},
  doi = {10.1007/978-3-642-39479-9_45},
  url = {http://dx.doi.org/10.1007/978-3-642-39479-9_45},
  researchr = {https://researchr.org/publication/XieHC13},
  cites = {0},
  citedby = {0},
  pages = {376-384},
  booktitle = {Intelligent Computing Theories - 9th International Conference, ICIC 2013, Nanning, China, July 28-31, 2013. Proceedings},
  editor = {De-Shuang Huang and Vitoantonio Bevilacqua and Juan Carlos Figueroa García and Prashan Premaratne},
  volume = {7995},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-39478-2},
}