On discovering potentially useful patterns from databases

Ying Xie, Tom Johnsten, Vijay V. Raghavan, Karthik Ramachandran. On discovering potentially useful patterns from databases. In 2006 IEEE International Conference on Granular Computing, GrC 2006, Atlanta, Georgia, USA, May 10-12, 2006. pages 494-497, IEEE, 2006. [doi]

Authors

Ying Xie

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Tom Johnsten

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Vijay V. Raghavan

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Karthik Ramachandran

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