Ying Xie, Tom Johnsten, Vijay V. Raghavan, Karthik Ramachandran. On discovering potentially useful patterns from databases. In 2006 IEEE International Conference on Granular Computing, GrC 2006, Atlanta, Georgia, USA, May 10-12, 2006. pages 494-497, IEEE, 2006. [doi]
@inproceedings{XieJRR06,
title = {On discovering potentially useful patterns from databases},
author = {Ying Xie and Tom Johnsten and Vijay V. Raghavan and Karthik Ramachandran},
year = {2006},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=34297&arnumber=1635848&count=189&index=112},
researchr = {https://researchr.org/publication/XieJRR06},
cites = {0},
citedby = {0},
pages = {494-497},
booktitle = {2006 IEEE International Conference on Granular Computing, GrC 2006, Atlanta, Georgia, USA, May 10-12, 2006},
publisher = {IEEE},
}