A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging

Zipeng Xie, Yongjie Li, Liguo Sun, Wentao Wu, Rui Cao, Xiaohui Tao. A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging. Sensors, 20(9):2670, 2020. [doi]

Abstract

Abstract is missing.