Mitigating electromigration of power supply networks using bidirectional current stress - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jing Xie, Vijaykrishnan Narayanan, Yuan Xie. Mitigating electromigration of power supply networks using bidirectional current stress. In Erik Brunvard, Ken Stevens, Joseph R. Cavallaro, Tong Zhang 0002, editors, Great Lakes Symposium on VLSI 2012, GLSVLSI'12, Salt Lake Cit, UT, USA, May 3-4, 2012. pages 299-302, ACM, 2012. [doi]

This author has not been identified. Look up 'Jing Xie' in GoogleThis author has not been identified. Look up 'Vijaykrishnan Narayanan' in GoogleThis author has not been identified. Look up 'Yuan Xie' in Google

runs on WebDSL