A Microwave Time Domain Reflectometry Technique Combining the Wavelet Decomposition Analysis and Artificial Neural Network for Detection of Defects in Dielectric Structures - researchr publication

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Yi Xie, Xiaoqing Yang, Piqiang Su, Yi He, Yunfeng Qiu. A Microwave Time Domain Reflectometry Technique Combining the Wavelet Decomposition Analysis and Artificial Neural Network for Detection of Defects in Dielectric Structures. IEEE T. Instrumentation and Measurement, 71:1-11, 2022. [doi]

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