Frequency Research of Microfluidic Wear Debris Detection Chip Based on Inductive Wheatstone Bridge

Yucai Xie, Hongpeng Zhang, Haotian Shi, Yuwei Zhang. Frequency Research of Microfluidic Wear Debris Detection Chip Based on Inductive Wheatstone Bridge. In 16th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2021, Xiamen, China, April 25-29, 2021. pages 780-785, IEEE, 2021. [doi]

Abstract

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