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Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes

Xing-hua He, Cong Zhang, Yong-Liang Zhang, Huan zhang Lu. Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes. In Khaled M. Elleithy, editor, Advanced Techniques in Computing Sciences and Software Engineering, Volume II of the proceedings of the 2008 International Conference on Systems, Computing Sciences and Software Engineering (SCSS), part of the International Joint Conferences on Computer, . pages 191-196, Springer, 2008. [doi]

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