Hanqing Xing, Degang Chen, Randall L. Geiger. On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. In 2008 IEEE International Conference on Electro/Information Technology, EIT 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20, 2008. pages 117-122, IEEE, 2008. [doi]
@inproceedings{XingCG08,
title = {On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering},
author = {Hanqing Xing and Degang Chen and Randall L. Geiger},
year = {2008},
doi = {10.1109/EIT.2008.4554278},
url = {http://dx.doi.org/10.1109/EIT.2008.4554278},
tags = {testing},
researchr = {https://researchr.org/publication/XingCG08},
cites = {0},
citedby = {0},
pages = {117-122},
booktitle = {2008 IEEE International Conference on Electro/Information Technology, EIT 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2030-8},
}