Hanqing Xing, Degang Chen, Randall L. Geiger. On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. In 2008 IEEE International Conference on Electro/Information Technology, EIT 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20, 2008. pages 117-122, IEEE, 2008. [doi]
Abstract is missing.