High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy

Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger. High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE T. Instrumentation and Measurement, 58(8):2697-2705, 2009. [doi]

Abstract

Abstract is missing.