A dual-mode built-in self-test technique for capacitive MEMS devices

Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone. A dual-mode built-in self-test technique for capacitive MEMS devices. IEEE T. Instrumentation and Measurement, 54(5):1739-1750, 2005. [doi]

Authors

Xingguo Xiong

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Yu-Liang Wu

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Wen-Ben Jone

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