Characterizing 3D Floating Gate NAND Flash

Qin Xiong, Fei Wu, Zhonghai Lu, Yue Zhu, You Zhou, Yibing Chu, Changsheng Xie, Ping Huang. Characterizing 3D Floating Gate NAND Flash. In Bruce E. Hajek, Sewoong Oh, Augustin Chaintreau, Leana Golubchik, Zhi-Li Zhang, editors, Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017. pages 31-32, ACM, 2017. [doi]

Abstract

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