The influence of Büttiker probe scattering to the port behavior of nanoscale metal-oxide-semiconductor devices

Jian-xiong, Gen Wang, Wolfgang Mathis. The influence of Büttiker probe scattering to the port behavior of nanoscale metal-oxide-semiconductor devices. I. J. Circuit Theory and Applications, 41(6):573-582, 2013. [doi]

Abstract

Abstract is missing.