Portable multiscale form measurement technique for structured specular surfaces based on phase measuring deflectometry

Yongjia Xu, Feng Gao 0006, Yang Yu, Jian Wang 0089, Xiangqian Jiang. Portable multiscale form measurement technique for structured specular surfaces based on phase measuring deflectometry. Vis. Intell., 1(1), 2023. [doi]

Abstract

Abstract is missing.