Xieyang Xu, Ryan Beckett, Karthick Jayaraman, Ratul Mahajan, David Walker. Test coverage metrics for the network. In Fernando A. Kuipers, Matthew C. Caesar, editors, ACM SIGCOMM 2021 Conference, Virtual Event, USA, August 23-27, 2021. pages 775-787, ACM, 2021. [doi]
@inproceedings{XuBJMW21,
title = {Test coverage metrics for the network},
author = {Xieyang Xu and Ryan Beckett and Karthick Jayaraman and Ratul Mahajan and David Walker},
year = {2021},
doi = {10.1145/3452296.3472941},
url = {https://doi.org/10.1145/3452296.3472941},
researchr = {https://researchr.org/publication/XuBJMW21},
cites = {0},
citedby = {0},
pages = {775-787},
booktitle = {ACM SIGCOMM 2021 Conference, Virtual Event, USA, August 23-27, 2021},
editor = {Fernando A. Kuipers and Matthew C. Caesar},
publisher = {ACM},
isbn = {978-1-4503-8383-7},
}