A low cost jitter separation and characterization method

Li Xu, Yan Duan, Degang Chen. A low cost jitter separation and characterization method. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-5, IEEE, 2015. [doi]

Authors

Li Xu

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Yan Duan

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Degang Chen

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