Off-state breakdown and leakage current transport analysis of AlGaN/GaN high electron mobility transistors - researchr publication authors

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Weizong Xu, Lihua Fu, Hai Lu, Dunjun Chen, Fangfang Ren, Rong Zhang, Youdou Zheng, Ke Wei, Xinyu Liu. Off-state breakdown and leakage current transport analysis of AlGaN/GaN high electron mobility transistors. Microelectronics Reliability, 54(11):2406-2409, 2014. [doi]

This author has not been identified. Look up 'Weizong Xu' in GoogleThis author has not been identified. Look up 'Lihua Fu' in GoogleThis author has not been identified. Look up 'Hai Lu' in GoogleThis author has not been identified. Look up 'Dunjun Chen' in GoogleThis author has not been identified. Look up 'Fangfang Ren' in GoogleThis author has not been identified. Look up 'Rong Zhang' in GoogleThis author has not been identified. Look up 'Youdou Zheng' in GoogleThis author has not been identified. Look up 'Ke Wei' in GoogleThis author has not been identified. Look up 'Xinyu Liu' in Google

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