Weizong Xu, Lihua Fu, Hai Lu, Dunjun Chen, Fangfang Ren, Rong Zhang, Youdou Zheng, Ke Wei, Xinyu Liu. Off-state breakdown and leakage current transport analysis of AlGaN/GaN high electron mobility transistors. Microelectronics Reliability, 54(11):2406-2409, 2014. [doi]
@article{XuFLCRZZWL14,
title = {Off-state breakdown and leakage current transport analysis of AlGaN/GaN high electron mobility transistors},
author = {Weizong Xu and Lihua Fu and Hai Lu and Dunjun Chen and Fangfang Ren and Rong Zhang and Youdou Zheng and Ke Wei and Xinyu Liu},
year = {2014},
doi = {10.1016/j.microrel.2014.06.005},
url = {http://dx.doi.org/10.1016/j.microrel.2014.06.005},
researchr = {https://researchr.org/publication/XuFLCRZZWL14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {11},
pages = {2406-2409},
}