Effective Multi-Fault Localization Based on Fault-Relevant Statistics

Sihan Xu, Ya Gao, Xiangrui Cai, Zhiyu Wang, Hua Ji. Effective Multi-Fault Localization Based on Fault-Relevant Statistics. In IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021, Madrid, Spain, July 12-16, 2021. pages 998-1003, IEEE, 2021. [doi]

Abstract

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