An SRAM Test Quality Improvement Method For Automotive chips

Tuanhui Xu, Junlin Huang, Mingen Bu, Zhe Jiang. An SRAM Test Quality Improvement Method For Automotive chips. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-4, IEEE, 2021. [doi]

Authors

Tuanhui Xu

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Junlin Huang

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Mingen Bu

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Zhe Jiang

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