Huan Xu, Geok Soon Hong, Jun Hong Zhou, Jihoon Hong, Keng Soon Woon. Coarse-to-Fine Tool Condition Monitoring using Multiple Gated Recurrent Units. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 3737-3742, IEEE, 2019. [doi]
Abstract is missing.