Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tianming Ni, Yingchun Lu. An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 59-62, IEEE, 2018. [doi]
@inproceedings{XuLZMHYNL18,
title = {An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs},
author = {Xiumin Xu and Huaguo Liang and Kai Zhou and Gaoliang Ma and Zhengfeng Huang and Maoxiang Yi and Tianming Ni and Yingchun Lu},
year = {2018},
doi = {10.1109/ATS.2018.00022},
url = {https://doi.org/10.1109/ATS.2018.00022},
researchr = {https://researchr.org/publication/XuLZMHYNL18},
cites = {0},
citedby = {0},
pages = {59-62},
booktitle = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
publisher = {IEEE},
isbn = {978-1-5386-9466-4},
}