Xiuqin Xu, Jiongjiong Mo, Wei Chen, Zhiyu Wang, Yong-Heng Shang, Yang Wang, Qin Zheng, Liping Wang, Zheng-Liang Huang, Fa-Xin Yu. A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs. Microelectronics Reliability, 68:30-38, 2017. [doi]
@article{XuMCWSWZWHY17,
title = {A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs},
author = {Xiuqin Xu and Jiongjiong Mo and Wei Chen and Zhiyu Wang and Yong-Heng Shang and Yang Wang and Qin Zheng and Liping Wang and Zheng-Liang Huang and Fa-Xin Yu},
year = {2017},
doi = {10.1016/j.microrel.2016.11.012},
url = {http://dx.doi.org/10.1016/j.microrel.2016.11.012},
researchr = {https://researchr.org/publication/XuMCWSWZWHY17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {68},
pages = {30-38},
}