A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs

Xiuqin Xu, Jiongjiong Mo, Wei Chen, Zhiyu Wang, Yong-Heng Shang, Yang Wang, Qin Zheng, Liping Wang, Zheng-Liang Huang, Fa-Xin Yu. A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs. Microelectronics Reliability, 68:30-38, 2017. [doi]

Abstract

Abstract is missing.