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Y. Z. Xu, O. Pohland, C. Cai, H. Puchner. Leakage Increase of Narrow and Short BCPMOS. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 51-54, IEEE Computer Society, 2004. [doi]