Gengyang Xu, Feng Pan, Pong C. Yuen. A Two-Stage Multi-Modal LLM Fine-Tuning Framework for Analyzing Building Surface Defects. In 33rd European Signal Processing Conference, EUSIPCO 2025, Palermo, Italy, September 8-12, 2025. pages 706-710, IEEE, 2025. [doi]
Abstract is missing.