Achieving high transition delay fault coverage with partial DTSFF scan chains - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Gefu Xu, Adit D. Singh. Achieving high transition delay fault coverage with partial DTSFF scan chains. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]

This author has not been identified. Look up 'Gefu Xu' in GoogleThis author has not been identified. Look up 'Adit D. Singh' in Google

runs on WebDSL