Gefu Xu, Adit D. Singh. Achieving high transition delay fault coverage with partial DTSFF scan chains. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]
@inproceedings{XuS07-3,
title = {Achieving high transition delay fault coverage with partial DTSFF scan chains},
author = {Gefu Xu and Adit D. Singh},
year = {2007},
doi = {10.1109/TEST.2007.4437608},
url = {http://dx.doi.org/10.1109/TEST.2007.4437608},
researchr = {https://researchr.org/publication/XuS07-3},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}