Qin Xu, Yifan Sun, Yali Li, Shengjin Wang. Attend and Align: Improving Deep Representations with Feature Alignment Layer for Person Retrieval. In 24th International Conference on Pattern Recognition, ICPR 2018, Beijing, China, August 20-24, 2018. pages 2148-2153, IEEE Computer Society, 2018. [doi]
Abstract is missing.