Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch

Hui Xu, Cong Sun, Le Zhou, Huaguo Liang, Zhengfeng Huang. Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch. IEEE Access, 9:113622-113630, 2021. [doi]

Abstract

Abstract is missing.