Towards Improved and Interpretable Deep Metric Learning via Attentive Grouping

Xinyi Xu, Zhengyang Wang, Cheng Deng, Hao Yuan, Shuiwang Ji. Towards Improved and Interpretable Deep Metric Learning via Attentive Grouping. IEEE Trans. Pattern Anal. Mach. Intell., 45(1):1189-1200, 2023. [doi]

Abstract

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