Test scheduling for built-in self-tested embedded SRAMs with data retention faults - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Qiang Xu, Baosheng Wang, André Ivanov, Fung Yu Young. Test scheduling for built-in self-tested embedded SRAMs with data retention faults. IET Computers & Digital Techniques, 1(3):256-264, 2007. [doi]

This author has not been identified. Look up 'Qiang Xu' in GoogleThis author has not been identified. Look up 'Baosheng Wang' in GoogleThis author has not been identified. Look up 'André Ivanov' in GoogleThis author has not been identified. Look up 'Fung Yu Young' in Google

runs on WebDSL