The following publications are possibly variants of this publication:
- Retention-Aware Test Scheduling for BISTed Embedded SRAMsQiang Xu, Baosheng Wang, F. Y. Young. emnets 2006: 83-88 [doi]
- A retention-aware test power model for embedded SRAMBaosheng Wang, Josh Yang, Yuejian Wu, André Ivanov. aspdac 2005: 1180-1183 [doi]
- A built-in self-test and self-diagnosis scheme for embedded SRAMChih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin. ats 2000: 45-50 [doi]
- A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAMChih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin. et, 18(6):637-647, 2002. [doi]