Baosheng Wang, Josh Yang, Yuejian Wu, André Ivanov. A retention-aware test power model for embedded SRAM. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 1180-1183, ACM Press, 2005. [doi]
Abstract is missing.