A Defect Inspection for Explosive Cartridge Using an Improved Visual Attention and Image-Weighted Eigenvalue

Liang Xu, Haibo Xu, Xiuxi Li, Ming Pan. A Defect Inspection for Explosive Cartridge Using an Improved Visual Attention and Image-Weighted Eigenvalue. IEEE T. Instrumentation and Measurement, 69(4):1191-1204, 2020. [doi]

Abstract

Abstract is missing.