Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data - researchr publication

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Qiuhao Xu, Chuqiao Xu, Junliang Wang. Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data. Auton. Intell. Syst., 2(1):24, 2022. [doi]

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