Kangkang Xu, Yang Yu 0015, Xu Fang. The Detection of Open and Leakage Faults for Prebond TSV Test Based on Weak Current Source. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(9):2768-2779, 2022. [doi]
@article{XuYF22,
title = {The Detection of Open and Leakage Faults for Prebond TSV Test Based on Weak Current Source},
author = {Kangkang Xu and Yang Yu 0015 and Xu Fang},
year = {2022},
doi = {10.1109/TCAD.2021.3114357},
url = {https://doi.org/10.1109/TCAD.2021.3114357},
researchr = {https://researchr.org/publication/XuYF22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {9},
pages = {2768-2779},
}