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SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects

Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty. SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects. ACM Trans. Design Autom. Electr. Syst., 14(1), 2009. [doi]

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