Detection methods for micro-cracked defects of photovoltaic modules based on machine vision - researchr publication authors

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Peng Xu, Wenju Zhou, Minrui Fei. Detection methods for micro-cracked defects of photovoltaic modules based on machine vision. In IEEE 3rd International Conference on Cloud Computing and Intelligence Systems, CCIS 2014, Shenzhen, China, November 27-29, 2014. pages 609-613, IEEE, 2014. [doi]

This author has not been identified. Look up 'Peng Xu' in GoogleThis author has not been identified. Look up 'Wenju Zhou' in GoogleThis author has not been identified. Look up 'Minrui Fei' in Google

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