Peng Xu, Wenju Zhou, Minrui Fei. Detection methods for micro-cracked defects of photovoltaic modules based on machine vision. In IEEE 3rd International Conference on Cloud Computing and Intelligence Systems, CCIS 2014, Shenzhen, China, November 27-29, 2014. pages 609-613, IEEE, 2014. [doi]
@inproceedings{XuZF14-0,
title = {Detection methods for micro-cracked defects of photovoltaic modules based on machine vision},
author = {Peng Xu and Wenju Zhou and Minrui Fei},
year = {2014},
doi = {10.1109/CCIS.2014.7175807},
url = {http://dx.doi.org/10.1109/CCIS.2014.7175807},
researchr = {https://researchr.org/publication/XuZF14-0},
cites = {0},
citedby = {0},
pages = {609-613},
booktitle = {IEEE 3rd International Conference on Cloud Computing and Intelligence Systems, CCIS 2014, Shenzhen, China, November 27-29, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4719-5},
}