Predicting IC Defect Level Using Diagnosis

Cheng Xue, R. D. Shawn Blanton. Predicting IC Defect Level Using Diagnosis. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 113-118, IEEE Computer Society, 2014. [doi]

Authors

Cheng Xue

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R. D. Shawn Blanton

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