Yang Xue, Xin Li, Ronald D. Blanton. Improving Diagnostic Resolution of Failing ICs Through Learning. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(6):1288-1297, 2018. [doi]
@article{XueLB18,
title = {Improving Diagnostic Resolution of Failing ICs Through Learning},
author = {Yang Xue and Xin Li and Ronald D. Blanton},
year = {2018},
doi = {10.1109/TCAD.2016.2611499},
url = {https://doi.org/10.1109/TCAD.2016.2611499},
researchr = {https://researchr.org/publication/XueLB18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {6},
pages = {1288-1297},
}